Low-Leakage and Low-Trigger-Voltage SCR Device for ESD Protection in 28-nm High-k Metal Gate CMOS Process

Chun Yu Lin, Yi Han Wu, Ming Dou Ker

研究成果: 雜誌貢獻期刊論文同行評審

17 引文 斯高帕斯(Scopus)

指紋

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Engineering & Materials Science

Chemical Compounds