Low-field flux creep behavior near second peak H2p in Pr-doped Bi-2212 single crystal

Y. Y. Hsu*, C. Y. Lin, B. N. Lin, Y. P. Sun, H. C. Ku

*此作品的通信作者

研究成果: 雜誌貢獻會議論文同行評審

摘要

Magnetic hysteresis M(H) and magnetic relaxation M(t) results on Pr-doped single-crystal Bi2Sr2Ca0.89Pr0.11Cu2O8+δ with optimum Tc = 88 K are reported. Superconducting H-T phase diagram with applied field parallel to single-crystal c-axis indicates that in the mixed state the anomalous second peak field and its onset field H2p/Hon varies from 900/800 G at 15 K to 210/85 G at 40 K with a plateau around 20-30 K. Low-field magnetic relaxation M(t) data near H2p/Hon indicates a distinct change of flux creep behavior. For H<Hon, the relaxation mechanism follows the collective creep model M(t) = M0[1+(μkBT/U0)ln(t/t0)]-1/μ and crosses to the vortex glass model M(t) = M0(t/t0)1/[1-(U(0)/k(B)T)] when H>Hon. Such a crossover behavior implies a change in vortex coupling mechanism from vortex quasi-lattice to entangled vortex glass.

原文英語
頁(從 - 到)931-932
頁數2
期刊Physica B: Condensed Matter
281-282
DOIs
出版狀態已發佈 - 2000 6月 1
對外發佈
事件Yamada Conference LI - The International Conference on Strongly Correlated Electron Systems (SCES '99) - Nagano, Jpn
持續時間: 1999 8月 241999 8月 28

ASJC Scopus subject areas

  • 電子、光磁材料
  • 凝聚態物理學
  • 電氣與電子工程

指紋

深入研究「Low-field flux creep behavior near second peak H2p in Pr-doped Bi-2212 single crystal」主題。共同形成了獨特的指紋。

引用此