跳至主導覽 跳至搜尋 跳過主要內容

Large area nanoparticle alignment by chemical lift-off lithography

  • Chong You Chen
  • , Chia Hsuan Chang
  • , Chang Ming Wang
  • , Yi Jing Li
  • , Hsiao Yuan Chu
  • , Hong Hseng Chan
  • , Yu Wei Huang
  • , Wei Ssu Liao*
  • *此作品的通信作者

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

13   連結會在新分頁中打開 引文 斯高帕斯(Scopus)

摘要

Nanoparticle alignment on the substrate attracts considerable attention due to its wide application in different fields, such as mechanical control, small size electronics, bio/chemical sensing, molecular manipulation, and energy harvesting. However, precise nanoparticle positioning and deposition control with high fidelity are still challenging. Herein, a straightforward strategy for high quality nanoparticle-alignment by chemical lift-off lithography (CLL) is demonstrated. This technique creates high resolution self-assembled monolayer (SAM) chemical patterns on gold substrates, enabling nanoparticle-selective deposition and precise alignment. The fabricated nanoparticle arrangement geometries and dimensions are well-controllable in a large area. With proper nanoparticle surface functionality control and adequate substrate molecular manipulation, well-defined nanoparticle arrays with single-particle-wide alignment resolution are achieved.

原文英語
文章編號71
期刊Nanomaterials
卷8
發行號2
DOIs
出版狀態已發佈 - 2018 2月
對外發佈是

ASJC Scopus subject areas

  • 一般化學工程
  • 一般材料科學

指紋

深入研究「Large area nanoparticle alignment by chemical lift-off lithography」主題。共同形成了獨特的指紋。

引用此