TY - JOUR
T1 - Investigation the interaction between the pulsed ultraviolet laser beams and PEDOT:PSS/graphene composite films
AU - Tseng, Shih Feng
AU - Hsiao, Wen Tse
AU - Chung, Chien Kai
AU - Chang, Tien Li
N1 - Publisher Copyright:
© 2015 Elsevier B.V. All rights reserved.
PY - 2015/11/30
Y1 - 2015/11/30
N2 - This research aims to investigate the interaction between pulsed ultraviolet (UV) laser beams and transparent PEDOT:PSS/graphene composite films. The laser ablated microstructure on film surfaces provides the electrical isolation and prevents the electrical contact from each location for the projected capacitive touch screen. Before the laser processing, the surface roughness, microhardness, spectrum and cross-sectional view of PEDOT:PSS/graphene composite film were measured by an atomic force microscope, a nanoindenter, a spectrometer and a scanning electron microscope, respectively. The focused UV laser beam was irradiated along line patterns with an overlapping rate of 60% and the applied laser fluences much over the ablation thresholds of 1.27 J/cm 2 to 3.82 J/cm 2 . The surface morphology, three-dimensional topography, and cross-sectional profile of isolated lines and electrode structures after laser microstructuring were measured by a confocal laser scanning microscope. By increasing the laser fluence from 1.27 J/cm 2 to 3.82 J/cm 2 , the ablated line widths and depths increased from 12.17 ± 0.24 μm to 21 ± 0.37 μm and from 190 ± 9 nm to 227 ± 15 nm, respectively. Moreover, the ablated lines of microstructuring electrodes had a clear and regular ablated edge quality.
AB - This research aims to investigate the interaction between pulsed ultraviolet (UV) laser beams and transparent PEDOT:PSS/graphene composite films. The laser ablated microstructure on film surfaces provides the electrical isolation and prevents the electrical contact from each location for the projected capacitive touch screen. Before the laser processing, the surface roughness, microhardness, spectrum and cross-sectional view of PEDOT:PSS/graphene composite film were measured by an atomic force microscope, a nanoindenter, a spectrometer and a scanning electron microscope, respectively. The focused UV laser beam was irradiated along line patterns with an overlapping rate of 60% and the applied laser fluences much over the ablation thresholds of 1.27 J/cm 2 to 3.82 J/cm 2 . The surface morphology, three-dimensional topography, and cross-sectional profile of isolated lines and electrode structures after laser microstructuring were measured by a confocal laser scanning microscope. By increasing the laser fluence from 1.27 J/cm 2 to 3.82 J/cm 2 , the ablated line widths and depths increased from 12.17 ± 0.24 μm to 21 ± 0.37 μm and from 190 ± 9 nm to 227 ± 15 nm, respectively. Moreover, the ablated lines of microstructuring electrodes had a clear and regular ablated edge quality.
KW - Ablated line
KW - Edge quality
KW - Microstructuring electrode
KW - PEDOT:PSS/graphene composite film
KW - Ultraviolet laser
UR - http://www.scopus.com/inward/record.url?scp=84948707259&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84948707259&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2015.08.131
DO - 10.1016/j.apsusc.2015.08.131
M3 - Article
AN - SCOPUS:84948707259
SN - 0169-4332
VL - 356
SP - 486
EP - 491
JO - Applied Surface Science
JF - Applied Surface Science
ER -