摘要
In these decades, integrated circuits for biomedical electronics applications have been designed and implemented in CMOS technologies. In order to be safely used by human, all microelectronic products must meet the reliability specifications. Therefore, electrostatic discharge (ESD) must be taken into consideration. To protect the biomedical integrated circuits in CMOS technologies from ESD damage, a dual-directional silicon-controlled rectifier (DDSCR) device was presented in this work. Experimental results show that the DDSCR has the advantages of high ESD robustness, low leakage, large swing tolerance, and good latchup immunity. The DDSCR was suitable for ESD protection in biomedical integrated circuits.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 2229-2235 |
| 頁數 | 7 |
| 期刊 | Microelectronics Reliability |
| 卷 | 55 |
| 發行號 | 11 |
| DOIs | |
| 出版狀態 | 已發佈 - 2015 |
ASJC Scopus subject areas
- 電子、光磁材料
- 原子與分子物理與光學
- 凝聚態物理學
- 安全、風險、可靠性和品質
- 表面、塗料和薄膜
- 電氣與電子工程
指紋
深入研究「Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-μm CMOS process」主題。共同形成了獨特的指紋。引用此
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