TY - JOUR
T1 - Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-μm CMOS process
AU - Lin, Chun Yu
AU - Chiu, Yan Lian
N1 - Publisher Copyright:
© 2015 Elsevier Ltd. All rights reserved.
PY - 2015
Y1 - 2015
N2 - In these decades, integrated circuits for biomedical electronics applications have been designed and implemented in CMOS technologies. In order to be safely used by human, all microelectronic products must meet the reliability specifications. Therefore, electrostatic discharge (ESD) must be taken into consideration. To protect the biomedical integrated circuits in CMOS technologies from ESD damage, a dual-directional silicon-controlled rectifier (DDSCR) device was presented in this work. Experimental results show that the DDSCR has the advantages of high ESD robustness, low leakage, large swing tolerance, and good latchup immunity. The DDSCR was suitable for ESD protection in biomedical integrated circuits.
AB - In these decades, integrated circuits for biomedical electronics applications have been designed and implemented in CMOS technologies. In order to be safely used by human, all microelectronic products must meet the reliability specifications. Therefore, electrostatic discharge (ESD) must be taken into consideration. To protect the biomedical integrated circuits in CMOS technologies from ESD damage, a dual-directional silicon-controlled rectifier (DDSCR) device was presented in this work. Experimental results show that the DDSCR has the advantages of high ESD robustness, low leakage, large swing tolerance, and good latchup immunity. The DDSCR was suitable for ESD protection in biomedical integrated circuits.
KW - Biomedical
KW - CMOS
KW - Electrostatic discharge (ESD)
KW - Silicon-controlled rectifier (SCR)
UR - http://www.scopus.com/inward/record.url?scp=84924370653&partnerID=8YFLogxK
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U2 - 10.1016/j.microrel.2015.02.020
DO - 10.1016/j.microrel.2015.02.020
M3 - Article
AN - SCOPUS:84924370653
SN - 0026-2714
VL - 55
SP - 2229
EP - 2235
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 11
ER -