Intelligent random vector generator based on probability analysis of circuit structure

Yu Min Kuo, Cheng Hung Lin, Chun Yao Wang, Shih Chieh Chang, Pei Hsin Ho

研究成果: 書貢獻/報告類型會議貢獻

2 引文 斯高帕斯(Scopus)

摘要

Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising.

原文英語
主出版物標題Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007
頁面344-349
頁數6
DOIs
出版狀態已發佈 - 2007 八月 28
事件8th International Symposium on Quality Electronic Design, ISQED 2007 - San Jose, CA, 美国
持續時間: 2007 三月 262007 三月 28

出版系列

名字Proceedings - Eighth International Symposium on Quality Electronic Design, ISQED 2007

其他

其他8th International Symposium on Quality Electronic Design, ISQED 2007
國家美国
城市San Jose, CA
期間07/3/2607/3/28

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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