摘要
The performance of a SQUID NDE probe with integrated planar SQUID gradiometers was compared to that with an electronic axial SQUID gradiometer. A circular excitation coil was used for the SQUID NDE probe with the planar gradiometer, whereas a differential excitation coil was adopted for the one with the axial gradiometer. These NDE systems are used to detect a buried flaw in aluminum plates, and the phase-depth relations of the buried flaw were found to show similar linear dependences. Overall, the SQUID NDE system with the planar gradiometer is relatively simple and practical for unshielded operations.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 521-526 |
| 頁數 | 6 |
| 期刊 | Journal of Low Temperature Physics |
| 卷 | 131 |
| 發行號 | 3-4 |
| DOIs | |
| 出版狀態 | 已發佈 - 2003 5月 |
ASJC Scopus subject areas
- 原子與分子物理與光學
- 一般材料科學
- 凝聚態物理學
指紋
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