Infrared and X-ray absorption studies of CdTe thin films

Wenjie Wang, Yu Cheng Yang, Ting Shan Chan, Peng Chen, Tzuen Rong Yang, Zhe Chuan Feng

研究成果: 書貢獻/報告類型會議貢獻

摘要

CdTe is an important material for thin film solar cells and radiation detectors, and with very small lattice mismatch of about 0.01% to InSb. Here, we study on a series of CdTe thin films on InSb substrate under different ion time and temperature from molecular beam epitaxy (MBE), by infrared reflectance (IRR) spectroscopy and extended X-ray absorption fine structure (EXAFS). Samples were measured by infrared reflectance spectroscopy. Simulation/fittings were performed to obtain their values of transverse optical (TO) phonon frequency, damping constant, mode strength, carrier concentration, etc. The local atomic structure and phonon properties as well as effects by the ion cleaning conditions are obtained. Samples were also measured by extended X-ray absorption fine structure (EXAFS). X-ray absorption spectra were collected at Cd K-edge (∼26711 eV) in 26500-27700 eV and X-ray fluorescence yield mode. After data processing, Fourier transform and program fittings, the bond lengths of the 1st nearest Cd-Te and 2nd nearest Cd-Cd atomic bonding as well as the coordination numbers are obtained.

原文英語
主出版物標題Thin Film Solar Technology IV
DOIs
出版狀態已發佈 - 2012 十二月 1
事件Thin Film Solar Technology IV - San Diego, CA, 美国
持續時間: 2013 八月 122013 八月 13

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
8470
ISSN(列印)0277-786X

其他

其他Thin Film Solar Technology IV
國家美国
城市San Diego, CA
期間13/8/1213/8/13

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • 引用此

    Wang, W., Yang, Y. C., Chan, T. S., Chen, P., Yang, T. R., & Feng, Z. C. (2012). Infrared and X-ray absorption studies of CdTe thin films. 於 Thin Film Solar Technology IV [84700T] (Proceedings of SPIE - The International Society for Optical Engineering; 卷 8470). https://doi.org/10.1117/12.929001