摘要
We report the structural, electrical and optical properties of bulk InAsN alloy with various nitrogen contents deposited on (100) InP substrates by using plasma-assisted gas source molecular beam epitaxy. It is found that the fundamental absorption edge of InAsN, as compared to that of InAs, shifts to higher energy due to Burstein-Moss effect. A dramatic increase of the electron effective mass in a nitrogen-containing III-V alloy is also observed from infrared reflectivity and Hall measurement on these degenerate InAsN samples. The sizeable increase on electron effective mass is consistent with the theoretical predictions based on band-anticrossing model.
原文 | 英語 |
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頁(從 - 到) | 61-66 |
頁數 | 6 |
期刊 | Materials Research Society Symposium - Proceedings |
卷 | 692 |
出版狀態 | 已發佈 - 2002 |
事件 | Progress in Semiconductor Materials for Optoelectronic Applications - Boston, MA, 美国 持續時間: 2001 11月 26 → 2001 11月 29 |
ASJC Scopus subject areas
- 一般材料科學
- 凝聚態物理學
- 材料力學
- 機械工業