摘要
A ferroelectric negative-capacitance (NC) transistor using aluminum-doped hafnium oxide (HfAlOx) with fluorine passivation is successfully demonstrated. The fluorine-passivated device shows a nearly hysteresis-free forward/reverse swing of sub-30 mV dec−1 for symmetric switch, a wide sub-60 mV (dec·swing)−1 range over 4 decades of drain current, an ultralow off-leakage current of 4 fA μm−1, and a high on/off current ratio of >108. The fluorine defect passivation (FP) reduces oxygen vacancies of ferroelectric HfAlOx to mitigate interface depolarization field and thereby reinforce surface potential amplification effect during NC operation.
原文 | 英語 |
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文章編號 | 1800493 |
期刊 | Physica Status Solidi - Rapid Research Letters |
卷 | 13 |
發行號 | 2 |
DOIs | |
出版狀態 | 已發佈 - 2019 2月 1 |
ASJC Scopus subject areas
- 一般材料科學
- 凝聚態物理學