Improved high-temperature switching characteristics of Y2O3/TiOx resistive memory through carrier depletion effect

Zhi Wei Zheng, Hsiao Hsuan Hsu, Chun Hu Cheng*, Po Chun Chen

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

4 引文 斯高帕斯(Scopus)

指紋

深入研究「Improved high-temperature switching characteristics of Y<sub>2</sub>O<sub>3</sub>/TiO<sub>x</sub> resistive memory through carrier depletion effect」主題。共同形成了獨特的指紋。

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds