Improved ESD Protection Design for High-Frequency Applications in CMOS Technology

Meng Ting Lin, Chun Yu Lin

研究成果: 書貢獻/報告類型會議論文篇章

摘要

An improved electrostatic discharge (ESD) protection design by using stacked diodes and silicon-controlled rectifier (SCR) as power-rail ESD clamp circuit is presented to protect the high-frequency integrated circuits in CMOS process. Experimental results show that the improved design can achieve higher ESD robustness without degrading the high-frequency performance. Based on its good performances during ESD stress and high-frequency operating conditions, the improved design is very suitable for ESD protection.

原文英語
主出版物標題2018 43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018
發行者IEEE Computer Society
ISBN(電子)9781538638095
DOIs
出版狀態已發佈 - 2018 十月 25
事件43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018 - Nagoya, 日本
持續時間: 2018 九月 92018 九月 14

出版系列

名字International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2018-September
ISSN(列印)2162-2027
ISSN(電子)2162-2035

會議

會議43rd International Conference on Infrared Millimeter and Terahertz Waves, IRMMW-THz 2018
國家/地區日本
城市Nagoya
期間2018/09/092018/09/14

ASJC Scopus subject areas

  • 能源工程與電力技術
  • 電氣與電子工程

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