Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms

Yu Chien Chiu, Chun Yen Chang, Hsiao Hsuan Hsu, Chun-Hu Cheng, Min-Hung Lee

研究成果: 書貢獻/報告類型會議貢獻

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms」主題。共同形成了獨特的指紋。

Engineering & Materials Science