Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms

Yu Chien Chiu, Chun Yen Chang, Hsiao Hsuan Hsu, Chun Hu Cheng, Min Hung Lee

研究成果: 書貢獻/報告類型會議論文篇章

1 引文 斯高帕斯(Scopus)

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Engineering & Materials Science