Impact of layout pickups to ESD robustness of MOS transistors in sub 100-nm CMOS process

Ming Dou Ker, Yong Ru Wen, Wen Yi Chen, Chun Yu Lin

研究成果: 書貢獻/報告類型會議貢獻

11 引文 斯高帕斯(Scopus)

指紋 深入研究「Impact of layout pickups to ESD robustness of MOS transistors in sub 100-nm CMOS process」主題。共同形成了獨特的指紋。

Engineering & Materials Science