摘要
We have characterized the oxide-confined vertical-cavity surface-emitting laser (VCSEL) using short-tip, tapping-mode tuning fork near-field scanning optical microscopy (TMTF-NSOM). The near-field radiation patterns of the VCSEL were measured. By comparing the topographic and optical images, we attribute the asymmetric transverse modes to the geometric defect outside the oxide aperture. We also performed spatially resolved spectroscopic imaging over the surface of the VCSEL by coupling NSOM to a spectrometer.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | I43-I46 |
| 期刊 | Scanning |
| 卷 | 26 |
| 發行號 | 5 SUPPL. |
| 出版狀態 | 已發佈 - 2004 |
ASJC Scopus subject areas
- 原子與分子物理與光學
- 儀器
指紋
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