Image-based system for measuring objects on an oblique surface

Chen-Chien James Hsu, Wei-Yen Wang, Yin Yu Lu, Ming Chi Lu

研究成果: 書貢獻/報告類型會議貢獻

1 引文 (Scopus)

摘要

This paper presents an image-based framework for measuring target objects on an oblique plane by using a single CCD camera and two parallel laser projectors beside the camera. Because of the alignment of the laser beams which form in parallel with the optical axis, projected spots in the image can be processed to establish relationships between distance and pixel counts between the projected spots in the image. Based on simple geometrical derivations without complex image processing, the proposed approach can measure the photographing distance, the distance between two arbitrary points on the oblique surface, and the incline angle. Experiment results have demonstrated the effectiveness of the proposed approach in measuring distant objects on an oblique plane.

原文英語
主出版物標題2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings
頁面313-317
頁數5
DOIs
出版狀態已發佈 - 2010 十月 18
事件2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Austin, TX, 美国
持續時間: 2010 五月 32010 五月 6

出版系列

名字2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings

其他

其他2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010
國家美国
城市Austin, TX
期間10/5/310/5/6

指紋

CCD cameras
Laser beams
Image processing
Pixels
Cameras
Lasers
Experiments
projectors
image processing
derivation
pixels
cameras
alignment
laser beams
lasers

ASJC Scopus subject areas

  • Instrumentation

引用此文

Hsu, C-C. J., Wang, W-Y., Lu, Y. Y., & Lu, M. C. (2010). Image-based system for measuring objects on an oblique surface. 於 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings (頁 313-317). [5488221] (2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings). https://doi.org/10.1109/IMTC.2010.5488221

Image-based system for measuring objects on an oblique surface. / Hsu, Chen-Chien James; Wang, Wei-Yen; Lu, Yin Yu; Lu, Ming Chi.

2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings. 2010. p. 313-317 5488221 (2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings).

研究成果: 書貢獻/報告類型會議貢獻

Hsu, C-CJ, Wang, W-Y, Lu, YY & Lu, MC 2010, Image-based system for measuring objects on an oblique surface. 於 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings., 5488221, 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings, 頁 313-317, 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010, Austin, TX, 美国, 10/5/3. https://doi.org/10.1109/IMTC.2010.5488221
Hsu C-CJ, Wang W-Y, Lu YY, Lu MC. Image-based system for measuring objects on an oblique surface. 於 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings. 2010. p. 313-317. 5488221. (2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings). https://doi.org/10.1109/IMTC.2010.5488221
Hsu, Chen-Chien James ; Wang, Wei-Yen ; Lu, Yin Yu ; Lu, Ming Chi. / Image-based system for measuring objects on an oblique surface. 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings. 2010. 頁 313-317 (2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings).
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