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High performance 50 nm CMOS devices for microprocessor and embedded processor core applications

  • Shih Fen Huang
  • , Chih Yung Lin
  • , Yu Shyang Huang
  • , Thomas Schafbauer
  • , Manfred Eller
  • , Yao Ching Cheng
  • , Shui Ming Cheng
  • , Sandrine Sportouch
  • , Wei Jin
  • , Nivo Rovedo
  • , Andreas Grassmann
  • , Yimin Huang
  • , James Brighten
  • , Chuan H. Liu
  • , Birgit Von Ehrenwall
  • , Norman Chen
  • , Jia Chen
  • , O. Seo Park
  • , Martin Commons
  • , Alan Thomas
  • Ming Tsan Lee, Steward Rauch, Larry Clevenger, Erdem Kaltalioglu, Pak Leung, Jenkon Chen, Thomas Schiml, Clement Wann

研究成果: 雜誌貢獻期刊論文同行評審

44   !!Link opens in a new tab 引文 斯高帕斯(Scopus)

摘要

50 nm CMOS transistors for high performance and low active power applications are presented. Good short-channel effect control is achieved down to 35 nm gate length. These transistors will be incorporated in a leading edge 100 nm technology, with optimized triple well, nitrided oxide gate dielectrics, 193-nm lithography, 9-level hierarchical Cu interconnects, and low-k dielectrics. These high performance transistors have the best current drive at a given leakage current reported in the literature.

原文英語
頁(從 - 到)237-240
頁數4
期刊Technical Digest-International Electron Devices Meeting
DOIs
出版狀態已發佈 - 2001
對外發佈

ASJC Scopus subject areas

  • 電子、光磁材料
  • 凝聚態物理學
  • 材料化學
  • 電氣與電子工程

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