摘要
50 nm CMOS transistors for high performance and low active power applications are presented. Good short-channel effect control is achieved down to 35 nm gate length. These transistors will be incorporated in a leading edge 100 nm technology, with optimized triple well, nitrided oxide gate dielectrics, 193-nm lithography, 9-level hierarchical Cu interconnects, and low-k dielectrics. These high performance transistors have the best current drive at a given leakage current reported in the literature.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 237-240 |
| 頁數 | 4 |
| 期刊 | Technical Digest-International Electron Devices Meeting |
| DOIs | |
| 出版狀態 | 已發佈 - 2001 |
| 對外發佈 | 是 |
ASJC Scopus subject areas
- 電子、光磁材料
- 凝聚態物理學
- 材料化學
- 電氣與電子工程
指紋
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