Growth and magnetism of low-temperature deposited Fe/Si(111) films as an intermediate layer for suppression of silicide formation

Wen Ting Tu; Chih Hsiung Wang; Ya Yun Huang; Wen Chin Lin

doi:10.1063/1.3537832

Growth and magnetism of low-temperature deposited Fe/Si(111) films as an intermediate layer for suppression of silicide formation

Wen Ting Tu^*, Chih Hsiung Wang, Ya Yun Huang, Wen Chin Lin

^*此作品的通信作者

物理學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

19 引文斯高帕斯（Scopus）

摘要

Low temperature (LT: 100 K) deposition of Fe on Si (111) 7×7 surface effectively reduces Fe-silicide formation at the Fe/Si interface, as compared with conventional room temperature (RT) growth. The interface condition of 5-15 monolayers (ML) LT-Fe/Si(111) remains stable at least up to 350 K. Si segregation was observed after annealing at 400 K. LT-grown Fe films also reveal a relatively flat surface morphology with a roughness of 0.4-0.6 nm. Thus, LT-Fe films were suggested as an intermediate layer for the subsequent RT-growth of Fe. We use a single domain model of magnetic anisotropy to fit the magnetic coercivity evolution of n ML RT-Fe on 5 ML LT-Fe/Si(111). Accordingly, we deduce the surface and volume-contributed magnetic anisotropy for discussion.

原文	英語
文章編號	023908
期刊	Journal of Applied Physics
卷	109
發行號	2
DOIs	https://doi.org/10.1063/1.3537832
出版狀態	已發佈 - 2011 1月 15

ASJC Scopus subject areas

一般物理與天文學

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10.1063/1.3537832

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title = "Growth and magnetism of low-temperature deposited Fe/Si(111) films as an intermediate layer for suppression of silicide formation",

abstract = "Low temperature (LT: 100 K) deposition of Fe on Si (111) 7×7 surface effectively reduces Fe-silicide formation at the Fe/Si interface, as compared with conventional room temperature (RT) growth. The interface condition of 5-15 monolayers (ML) LT-Fe/Si(111) remains stable at least up to 350 K. Si segregation was observed after annealing at 400 K. LT-grown Fe films also reveal a relatively flat surface morphology with a roughness of 0.4-0.6 nm. Thus, LT-Fe films were suggested as an intermediate layer for the subsequent RT-growth of Fe. We use a single domain model of magnetic anisotropy to fit the magnetic coercivity evolution of n ML RT-Fe on 5 ML LT-Fe/Si(111). Accordingly, we deduce the surface and volume-contributed magnetic anisotropy for discussion.",

author = "Tu, {Wen Ting} and Wang, {Chih Hsiung} and Huang, {Ya Yun} and Lin, {Wen Chin}",

note = "Funding Information: This work was supported by the National Science Council of Taiwan under Grant Nos. NSC 96-2112-M-003-015-MY3, NSC 99-2738-M-003-001, and NSC 99-2112-M-003-009-MY3.",

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AU - Tu, Wen Ting

AU - Wang, Chih Hsiung

AU - Huang, Ya Yun

AU - Lin, Wen Chin

N1 - Funding Information: This work was supported by the National Science Council of Taiwan under Grant Nos. NSC 96-2112-M-003-015-MY3, NSC 99-2738-M-003-001, and NSC 99-2112-M-003-009-MY3.

PY - 2011/1/15

Y1 - 2011/1/15

N2 - Low temperature (LT: 100 K) deposition of Fe on Si (111) 7×7 surface effectively reduces Fe-silicide formation at the Fe/Si interface, as compared with conventional room temperature (RT) growth. The interface condition of 5-15 monolayers (ML) LT-Fe/Si(111) remains stable at least up to 350 K. Si segregation was observed after annealing at 400 K. LT-grown Fe films also reveal a relatively flat surface morphology with a roughness of 0.4-0.6 nm. Thus, LT-Fe films were suggested as an intermediate layer for the subsequent RT-growth of Fe. We use a single domain model of magnetic anisotropy to fit the magnetic coercivity evolution of n ML RT-Fe on 5 ML LT-Fe/Si(111). Accordingly, we deduce the surface and volume-contributed magnetic anisotropy for discussion.

AB - Low temperature (LT: 100 K) deposition of Fe on Si (111) 7×7 surface effectively reduces Fe-silicide formation at the Fe/Si interface, as compared with conventional room temperature (RT) growth. The interface condition of 5-15 monolayers (ML) LT-Fe/Si(111) remains stable at least up to 350 K. Si segregation was observed after annealing at 400 K. LT-grown Fe films also reveal a relatively flat surface morphology with a roughness of 0.4-0.6 nm. Thus, LT-Fe films were suggested as an intermediate layer for the subsequent RT-growth of Fe. We use a single domain model of magnetic anisotropy to fit the magnetic coercivity evolution of n ML RT-Fe on 5 ML LT-Fe/Si(111). Accordingly, we deduce the surface and volume-contributed magnetic anisotropy for discussion.

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Growth and magnetism of low-temperature deposited Fe/Si(111) films as an intermediate layer for suppression of silicide formation

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