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Growth and characterization of InN epi-films on nitrided Si
3
N
4
layer by RF-MOMBE
Sheng Chen, Wei Chun Chen,
Chin Pao Cheng
機電工程學系
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Engineering & Materials Science
Molecular beam epitaxy
Nitridation
Plasmas
Characterization (materials science)
Metals
Diffraction patterns
Substrates
Hall effect
Stoichiometry
Refraction
Optical properties
Silicon nitride
Structural properties
Electric properties
Crystalline materials
X ray diffraction
Chemical Compounds
silicon nitride
Molecular beam epitaxy
Plasmas
Characterization (materials science)
Metals
Nitridation
Diffraction patterns
Substrates
Hall effect
Stoichiometry
Refraction
Optical properties
Structural properties
Electric properties
Crystalline materials
X ray diffraction
Physics & Astronomy
radio frequencies
molecular beam epitaxy
characterization
metals
ellipsometers
wurtzite
silicon nitrides
stoichiometry
Hall effect
refraction
analyzers
diffraction patterns
electrical properties
optical properties
x rays