Flux-to-voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions

J. T. Jeng; H. C. Hung; C. R. Lin; C. H. Wu; K. L. Chen; J. C. Chen; Hong-Chang Yang; Shu-Hsien Liao; Herng-Er Horng

doi:10.1109/TASC.2005.850063

Flux-to-voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions

J. T. Jeng, H. C. Hung, C. R. Lin, C. H. Wu, K. L. Chen, J. C. Chen, Hong-Chang Yang, Shu-Hsien Liao, Herng-Er Horng

研究成果: 雜誌貢獻 › 文章 › 同行評審

8 引文斯高帕斯（Scopus）

摘要

The factors affecting the flux-to-voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions were investigated. By using the proposed critical-current-modulation model, it is found that the voltage swing of the series-SQUID array is suppressed greatly by the spread in critical currents of Josephson junctions. For the inductance L = 80 pH and the logarithmic average critical current 2 I_ave = 20 μA. of the component SQUID, the allowed spread in critical currents of Josephson junctions is 0.4 I_ave to 2.2 I_ave for achieving the low flux noise with the series SQUID array.

原文	英語
頁（從 - 到）	793-796
頁數	4
期刊	IEEE Transactions on Applied Superconductivity
卷	15
發行號	2 PART I
DOIs	https://doi.org/10.1109/TASC.2005.850063
出版狀態	已發佈 - 2005 六月 1

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/TASC.2005.850063

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Flux-to-voltage transfer function of the series-SQUID array with grain-boundary Josephson junctions. / Jeng, J. T.; Hung, H. C.; Lin, C. R.; Wu, C. H.; Chen, K. L.; Chen, J. C.; Yang, Hong-Chang; Liao, Shu-Hsien ; Horng, Herng-Er.

於: IEEE Transactions on Applied Superconductivity, 卷 15, 編號 2 PART I, 01.06.2005, p. 793-796.

研究成果: 雜誌貢獻 › 文章 › 同行評審

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