TY - GEN
T1 - First-Principles DFT+U Study of Orthorhombic Rivalry in Ferroelectric Hafnia-Zirconia
AU - Januar, Mochamad
AU - Lee, Min Hung
N1 - Publisher Copyright:
© 2026 IEEE.
PY - 2026
Y1 - 2026
N2 - Ferroelectric Hf1-xZrxO2 (HZO) is a leading candidate for silicon-technology-compatible non-volatile memory, yet the microscopic origin of its polarization remains under debate due to the near-degeneracy of polar orthorhombic phases. Here, we employ first-principles DFT+U calculations to systematically compare the structural, electronic, and ferroelectric properties of the Pca21 and Pmn21 polymorphs across a range of Hf/Zr stoichiometries. Equation-of-state analysis confirms mechanical stability for both phases, with Pmn21 exhibiting slightly larger lattice constants. Energetic trends reveal that phase stability is highly sensitive to Zr content, whereas the spontaneous polarization (∼56-60 μC cm-2) and wide band gap (∼6 eV) remain remarkably robust. This resilience originates from the fact that substitutional Zr modifies orbital hybridization but preserves the underlying O-2p to Hf/Zr-d charge-transfer mechanism in both polymorphs. These findings show that stoichiometry dictates phase stability, while ferroelectric functionality remains robust against cation ratio and polymorphic competition, offering symmetry- and orbital-guided principles for designing hafnia-zirconia in future memory and logic devices.
AB - Ferroelectric Hf1-xZrxO2 (HZO) is a leading candidate for silicon-technology-compatible non-volatile memory, yet the microscopic origin of its polarization remains under debate due to the near-degeneracy of polar orthorhombic phases. Here, we employ first-principles DFT+U calculations to systematically compare the structural, electronic, and ferroelectric properties of the Pca21 and Pmn21 polymorphs across a range of Hf/Zr stoichiometries. Equation-of-state analysis confirms mechanical stability for both phases, with Pmn21 exhibiting slightly larger lattice constants. Energetic trends reveal that phase stability is highly sensitive to Zr content, whereas the spontaneous polarization (∼56-60 μC cm-2) and wide band gap (∼6 eV) remain remarkably robust. This resilience originates from the fact that substitutional Zr modifies orbital hybridization but preserves the underlying O-2p to Hf/Zr-d charge-transfer mechanism in both polymorphs. These findings show that stoichiometry dictates phase stability, while ferroelectric functionality remains robust against cation ratio and polymorphic competition, offering symmetry- and orbital-guided principles for designing hafnia-zirconia in future memory and logic devices.
UR - https://www.scopus.com/pages/publications/105040813140
UR - https://www.scopus.com/pages/publications/105040813140#tab=citedBy
U2 - 10.1109/EDTM65772.2026.11496760
DO - 10.1109/EDTM65772.2026.11496760
M3 - Conference contribution
AN - SCOPUS:105040813140
T3 - 10th IEEE Electron Devices Technology and Manufacturing Conference: Emerging Semiconductor Devices and Manufacturing Technologies, EDTM 2026
BT - 10th IEEE Electron Devices Technology and Manufacturing Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th IEEE Electron Devices Technology and Manufacturing Conference: Emerging Semiconductor Devices and Manufacturing Technologies, EDTM 2026
Y2 - 1 March 2026 through 4 March 2026
ER -