摘要
The corresponding energy landscape and surface potential are deduced from the experimental ferroelectricity of HfZrO2 (HZO) for low-power steep-slope transistor applications. The anti-ferroelectric (AFE) in annealed 600°C HZO extracted electrostatic potential gain from the measured polarization hysteresis loop and calculated subthreshold swing 33 mV/dec over six decades of IDS. A feasible concept of coupling the AFE HZO is experimentally established with the validity of negative capacitance and beneficial for steep-slope FET development in future generation.
原文 | 英語 |
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文章編號 | 7110513 |
頁(從 - 到) | 377-381 |
頁數 | 5 |
期刊 | IEEE Journal of the Electron Devices Society |
卷 | 3 |
發行號 | 4 |
DOIs | |
出版狀態 | 已發佈 - 2015 7月 1 |
ASJC Scopus subject areas
- 生物技術
- 電子、光磁材料
- 電氣與電子工程