Fatigue Mechanism of Antiferroelectric Hf0.1Zr0.9O2 Toward Endurance Immunity by Opposite Polarity Cycling Recovery (OPCR) for eDRAM

K. Y. Hsiang, J. Y. Lee, Z. F. Lou, F. S. Chang, Y. C. Chen, Z. X. Li, M. H. Liao, C. W. Liu, T. H. Hou, P. Su, M. H. Lee*

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研究成果: 雜誌貢獻期刊論文同行評審

4 引文 斯高帕斯(Scopus)

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Immunology and Microbiology

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