Far-IR reflectance spectra analysis of CdZnTe and related materials

Tzuen Rong Yang*, Sheng Hong Jhang, Yen Hao Shih, Fu Chung Hou, Yu Chang Yang, P. Becla, Der Chi Tien, Zhe Chuan Feng

*此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

摘要

Far-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" or "intermediate-mode" behavior depending on the vibration characteristics of the end binary members. The CdSeTe called CST were found to be single-crystal with the zincblende structure. These four samples labeled with CST5, CST15, CST25, and CST35, which correspond with the composition of Se, 5%, 15%, 25%, 35%, respectively. The intensity of CdTe-like TO band decays with x increasing, and the peak position increases from 140 cm-1 to 145 cm-1. In the other hand, the intensity of CdSe-like TO band grows with x increasing, and the peak position of CdSe-like TO band increases from 174 cm-1 to 181 cm-1. We use the model of dielectric function and using Least-Square fit to find the optical and transport parameters. By the infrared spectra analysis, we found the conductivity of CdZnxTe1-x increase with increasing of x value and the conductivity of CdSe xTe1-x decrease with increasing of x value.

原文英語
主出版物標題Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
DOIs
出版狀態已發佈 - 2009
事件Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI - San Diego, CA, 美国
持續時間: 2009 八月 32009 八月 6

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
7449
ISSN(列印)0277-786X

其他

其他Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
國家/地區美国
城市San Diego, CA
期間2009/08/032009/08/06

ASJC Scopus subject areas

  • 電子、光磁材料
  • 凝聚態物理學
  • 電腦科學應用
  • 應用數學
  • 電氣與電子工程

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