TY - JOUR
T1 - Fabry–Pérot Resonant Memristor for Neuromorphic Photonic Computing
AU - Yao, Yung Chi
AU - Lee, Chia Jung
AU - Chen, Yong Jun
AU - Qiu, Zi Xuan
AU - Lin, Chia Jui
AU - Oh, Hongseok
AU - Chuang, Ricky W.
AU - Lee, Ya Ju
N1 - Publisher Copyright:
© 2025 Wiley-VCH GmbH.
PY - 2026/4/7
Y1 - 2026/4/7
N2 - A Fabry–Pérot enhanced resistive random-access memory (FP-RRAM) comprising an Ag/BFO/ITO stack integrated with a distributed Bragg reflector (DBR) is demonstrated, enabling dual electrical and optical memory readout. Well-separated cavity resonances allow reliable optical discrimination between high- and low-resistance states. Cross-sectional transmission electron microscopy (TEM) coupled with energy-dispersive X-ray spectroscopy (EDS) mapping reveals spatially localized Ag migration and oxygen-vacancy filament formation, collectively modulating the effective permittivity of the BFO layer. Momentum-resolved reflectance measurements and finite-difference time-domain (FDTD) simulations further validate that resistive switching tunes the cavity eigenmode through changes in the effective refractive index. Combined electrical and optical characterization exhibits pronounced hysteresis and bistability, with robust retention and synchronized modulation observed up to a 50-ms timescale. By employing the Maxwell–Garnett effective medium approximation, ionic reconfiguration with optical response, revealing sharp increases in both Ag and oxygen-vacancy volume fractions at the set threshold, with Ag migration dominating the switching kinetics is quantitatively correlated. This integrated structural, optical, and theoretical analysis directly links nanoscale filament dynamics with macroscopic photonic modulations. Additionally, the FP-RRAM demonstrates linear optical weight updates with enhanced state resolution for precise synaptic modulation, leading to higher recognition accuracy than purely electrical programming. These results establish FP-RRAM as a reliable, electrically programmable, and optically addressable memory platform, offering a promising avenue for neuromorphic and photonic computing applications.
AB - A Fabry–Pérot enhanced resistive random-access memory (FP-RRAM) comprising an Ag/BFO/ITO stack integrated with a distributed Bragg reflector (DBR) is demonstrated, enabling dual electrical and optical memory readout. Well-separated cavity resonances allow reliable optical discrimination between high- and low-resistance states. Cross-sectional transmission electron microscopy (TEM) coupled with energy-dispersive X-ray spectroscopy (EDS) mapping reveals spatially localized Ag migration and oxygen-vacancy filament formation, collectively modulating the effective permittivity of the BFO layer. Momentum-resolved reflectance measurements and finite-difference time-domain (FDTD) simulations further validate that resistive switching tunes the cavity eigenmode through changes in the effective refractive index. Combined electrical and optical characterization exhibits pronounced hysteresis and bistability, with robust retention and synchronized modulation observed up to a 50-ms timescale. By employing the Maxwell–Garnett effective medium approximation, ionic reconfiguration with optical response, revealing sharp increases in both Ag and oxygen-vacancy volume fractions at the set threshold, with Ag migration dominating the switching kinetics is quantitatively correlated. This integrated structural, optical, and theoretical analysis directly links nanoscale filament dynamics with macroscopic photonic modulations. Additionally, the FP-RRAM demonstrates linear optical weight updates with enhanced state resolution for precise synaptic modulation, leading to higher recognition accuracy than purely electrical programming. These results establish FP-RRAM as a reliable, electrically programmable, and optically addressable memory platform, offering a promising avenue for neuromorphic and photonic computing applications.
KW - Fabry–Pérot
KW - Maxwell–Garnett
KW - bismuth ferrite (BiFeO, BFO)
KW - neuromorphic and photonic computing
KW - resistive random-access memory (RRAM)
UR - https://www.scopus.com/pages/publications/105023281035
UR - https://www.scopus.com/pages/publications/105023281035#tab=citedBy
U2 - 10.1002/adfm.202525651
DO - 10.1002/adfm.202525651
M3 - Article
AN - SCOPUS:105023281035
SN - 1616-301X
VL - 36
JO - Advanced Functional Materials
JF - Advanced Functional Materials
IS - 28
M1 - e25651
ER -