Fabrication of ultra-sharp single atom tips

Tsu-Yi Fu, Chia Lun Chiang, Rung Jiun Lin, Jin Long Hou, Hong Shi Kuo, Ing Shouh Hwang, Tien T. Tsong

研究成果: 書貢獻/報告類型會議貢獻

摘要

Ultra high vacuum - field ion microscopy (UHV-FIM) with atomic resolution was used to study the methods of preparing ultra-sharp single atom tips. Several treatments including annealing, depositing, exposing to special gas, keep in a given atmosphere, and so on were the possible tactics to sharpen the tips. The sharpen results of various treatments were observed by field ion microscope. Two kinds of magnetic nano tips were formed. One is a PtCo pyramidal tip formed by surface faceting, the other is a Pt based Co tip formed by the SK mode epitaxy.

原文英語
主出版物標題INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings
頁面142-143
頁數2
DOIs
出版狀態已發佈 - 2010 五月 5
事件2010 3rd International Nanoelectronics Conference, INEC 2010 - Hongkong, 中国
持續時間: 2010 一月 32010 一月 8

其他

其他2010 3rd International Nanoelectronics Conference, INEC 2010
國家中国
城市Hongkong
期間2010/01/032010/01/08

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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