Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3

Mei Yu Chen; P. J. Chang; C. T. Chia; Y. C. Lee; I. N. Lin; L. J. Lin; J. F. Lee; H. Y. Lee; T. Shimada

doi:10.1016/j.jeurceramsoc.2006.11.025

Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg_1/3Ta_2/3)O₃

Mei Yu Chen, P. J. Chang, C. T. Chia^*, Y. C. Lee, I. N. Lin, L. J. Lin, J. F. Lee, H. Y. Lee, T. Shimada

^*此作品的通信作者

物理學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

4 引文斯高帕斯（Scopus）

摘要

Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni_1/3Ta_2/3)O₃ + (1 - x)Ba(Mg_1/3Ta_2/3)O₃ samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO₆ octahedra, that is A_1g(O) phonon near 800 cm^-1, are strongly correlated to the microwave properties of xBa(Ni_1/3Mg_2/3)O₃ + (1 - x)Ba(Mg_1/3Ta_2/3)O₃ samples. The large Raman shift and the large width of the A_1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg_1/3Ta_2/3)O₃ ceramic.

原文	英語
頁（從 - 到）	2995-2999
頁數	5
期刊	Journal of the European Ceramic Society
卷	27
發行號	8-9 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.jeurceramsoc.2006.11.025
出版狀態	已發佈 - 2007

ASJC Scopus subject areas

陶瓷和複合材料
材料化學

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10.1016/j.jeurceramsoc.2006.11.025

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@article{dcb279c3edfc4585bf74deb10a371310,

title = "Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3",

abstract = "Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cm-1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg1/3Ta2/3)O3 ceramic.",

keywords = "Extended X-ray absorption fine structure (EXAFS)",

author = "Chen, {Mei Yu} and Chang, {P. J.} and Chia, {C. T.} and Lee, {Y. C.} and Lin, {I. N.} and Lin, {L. J.} and Lee, {J. F.} and Lee, {H. Y.} and T. Shimada",

note = "Funding Information: Financial support of this work from the National Science Council of Taiwan, ROC, under the Contract Nos. NSC 94-2112-M-003-007 and NSC 93-2112-M-003-012 is acknowledged.",

year = "2007",

doi = "10.1016/j.jeurceramsoc.2006.11.025",

language = "English",

volume = "27",

pages = "2995--2999",

journal = "Journal of the European Ceramic Society",

issn = "0955-2219",

publisher = "Elsevier BV",

number = "8-9 SPEC. ISS.",

}

TY - JOUR

T1 - Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3

AU - Chen, Mei Yu

AU - Chang, P. J.

AU - Chia, C. T.

AU - Lee, Y. C.

AU - Lin, I. N.

AU - Lin, L. J.

AU - Lee, J. F.

AU - Lee, H. Y.

AU - Shimada, T.

N1 - Funding Information: Financial support of this work from the National Science Council of Taiwan, ROC, under the Contract Nos. NSC 94-2112-M-003-007 and NSC 93-2112-M-003-012 is acknowledged.

PY - 2007

Y1 - 2007

N2 - Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cm-1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg1/3Ta2/3)O3 ceramic.

AB - Raman, X-ray diffraction and extended X-ray absorption fine structure (EXAFS) measurements of xBa(Ni1/3Ta2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples with x = 0-0.03 were performed to reveal the nickel doping effect on the microwave properties. EXAFS result clearly shows that the nickel is located on the Mg lattice site. We also found that, as the nickel concentration increases, microwave dielectric constant decreases with the Ta{single bond}O and Ni{single bond}O bond distances. X-ray diffraction shows that the 1:2 ordered structure is degraded with the increasing of nickel concentration. The stretching phonon of the TaO6 octahedra, that is A1g(O) phonon near 800 cm-1, are strongly correlated to the microwave properties of xBa(Ni1/3Mg2/3)O3 + (1 - x)Ba(Mg1/3Ta2/3)O3 samples. The large Raman shift and the large width of the A1g(O) imply rigid but distorted oxygen octahedral structure, therefore, the effect of nickel doping lowers the dielectric constant and the Q × f value of Ba(Mg1/3Ta2/3)O3 ceramic.

KW - Extended X-ray absorption fine structure (EXAFS)

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JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

IS - 8-9 SPEC. ISS.

ER -

Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg1/3Ta2/3)O3

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Extended X-ray absorption fine structure, X-ray diffraction and Raman analysis of nickel-doped Ba(Mg_1/3Ta_2/3)O₃