摘要
Information regarding the conductivity type of Si/GeOx/Ni structures with various stoichiometry has been obtained using experiments on injection of minority carriers from n- and p-type silicon. Results show that non-stoichiometric GeOx films exhibit bipolar conductivity, that is, holes as well as electrons contribute to the charge transport. Stoichiometric GeO2 films exhibit unipolar electron conductivity.
| 原文 | 英語 |
|---|---|
| 文章編號 | 232904 |
| 期刊 | Applied Physics Letters |
| 卷 | 103 |
| 發行號 | 23 |
| DOIs | |
| 出版狀態 | 已發佈 - 2013 12月 2 |
ASJC Scopus subject areas
- 物理與天文學(雜項)
指紋
深入研究「Evolution of the conductivity type in germania by varying the stoichiometry」主題。共同形成了獨特的指紋。引用此
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS