摘要
A trilayer resistive memory with a low picojoule switching energy shows highly uniform current distribution, fast switching speed of 10 ns, and robust endurance cycling of 106 cycles under high-temperature (343 K) operation. Such good performance is related to high-temperature stable Ni electrode, fast electron hopping via nanocrystallized anatase TiO2, and nonuniform electric-field distribution to dilute cycling stress. The evaluation of thermal stability is mandatory for the application of reliable high-density three-dimensional nonvolatile memory.
| 原文 | 英語 |
|---|---|
| 文章編號 | 041203 |
| 期刊 | Applied Physics Express |
| 卷 | 6 |
| 發行號 | 4 |
| DOIs | |
| 出版狀態 | 已發佈 - 2013 4月 |
ASJC Scopus subject areas
- 一般工程
- 一般物理與天文學
指紋
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