ESD self-protection design on 2.4-GHz T/R switch for RF application in CMOS process

Chun Yu Lin, Rui Hong Liu, Ming Dou Ker

研究成果: 書貢獻/報告類型會議貢獻

3 引文 (Scopus)

摘要

An RF transceiver front-end for 2.4GHz applications realized by a fully integrated T/R switch with ESD self-protection capability is presented in this work. Experimental results show that the proposed design without using any additional ESD protection device can provide enough ESD self-protection capability with good RF performances.

原文英語
主出版物標題2016 International Reliability Physics Symposium, IRPS 2016
發行者Institute of Electrical and Electronics Engineers Inc.
頁面EL11-EL14
ISBN(電子)9781467391368
DOIs
出版狀態已發佈 - 2016 九月 22
事件2016 International Reliability Physics Symposium, IRPS 2016 - Pasadena, 美国
持續時間: 2016 四月 172016 四月 21

出版系列

名字IEEE International Reliability Physics Symposium Proceedings
2016-September
ISSN(列印)1541-7026

其他

其他2016 International Reliability Physics Symposium, IRPS 2016
國家美国
城市Pasadena
期間16/4/1716/4/21

指紋

Transceivers
Switches

ASJC Scopus subject areas

  • Engineering(all)

引用此文

Lin, C. Y., Liu, R. H., & Ker, M. D. (2016). ESD self-protection design on 2.4-GHz T/R switch for RF application in CMOS process. 於 2016 International Reliability Physics Symposium, IRPS 2016 (頁 EL11-EL14). [7574602] (IEEE International Reliability Physics Symposium Proceedings; 卷 2016-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS.2016.7574602

ESD self-protection design on 2.4-GHz T/R switch for RF application in CMOS process. / Lin, Chun Yu; Liu, Rui Hong; Ker, Ming Dou.

2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. EL11-EL14 7574602 (IEEE International Reliability Physics Symposium Proceedings; 卷 2016-September).

研究成果: 書貢獻/報告類型會議貢獻

Lin, CY, Liu, RH & Ker, MD 2016, ESD self-protection design on 2.4-GHz T/R switch for RF application in CMOS process. 於 2016 International Reliability Physics Symposium, IRPS 2016., 7574602, IEEE International Reliability Physics Symposium Proceedings, 卷 2016-September, Institute of Electrical and Electronics Engineers Inc., 頁 EL11-EL14, 2016 International Reliability Physics Symposium, IRPS 2016, Pasadena, 美国, 16/4/17. https://doi.org/10.1109/IRPS.2016.7574602
Lin CY, Liu RH, Ker MD. ESD self-protection design on 2.4-GHz T/R switch for RF application in CMOS process. 於 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. EL11-EL14. 7574602. (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2016.7574602
Lin, Chun Yu ; Liu, Rui Hong ; Ker, Ming Dou. / ESD self-protection design on 2.4-GHz T/R switch for RF application in CMOS process. 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 頁 EL11-EL14 (IEEE International Reliability Physics Symposium Proceedings).
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