TY - GEN
T1 - ESD Protection Design with Low-Leakage Consideration for Silicon Chips of IoT Applications
AU - Ker, Ming Dou
AU - Lin, Chun Yu
AU - Wu, Yi Han
AU - Wang, Wen Tai
N1 - Funding Information:
This \vork \vas supported in part by Global lJnichip Corporation, Tai\van, and in palt by Ministty of Science and Technology, Tai,van, under ('ontracts of MOST 105-2221-E-009-166 and MOST 106-2622-8-009-007 -TEl.
Publisher Copyright:
© 2017 IEEE.
PY - 2018/8/24
Y1 - 2018/8/24
N2 - On-chip electrostatic discharge (ESD) protection design with low-leakage consideration for the silicon chips of IoT applications is presented. The proposed ESD protection design uses the fast turn-on silicon-controlled rectifier (SCR) device to implement the power-rail ESD clamp circuit. Experimental results verified in TSMC 28nm CMOS process have shown that the proposed design has advantages of low leakage current (2∼3nA), low trigger voltage (∼2V), high ESD robustness (>8kV), and free to latchup issue.
AB - On-chip electrostatic discharge (ESD) protection design with low-leakage consideration for the silicon chips of IoT applications is presented. The proposed ESD protection design uses the fast turn-on silicon-controlled rectifier (SCR) device to implement the power-rail ESD clamp circuit. Experimental results verified in TSMC 28nm CMOS process have shown that the proposed design has advantages of low leakage current (2∼3nA), low trigger voltage (∼2V), high ESD robustness (>8kV), and free to latchup issue.
KW - CMOS
KW - ESD protection
KW - electrostatic discharge (ESD)
KW - low-leakage
UR - http://www.scopus.com/inward/record.url?scp=85053845896&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85053845896&partnerID=8YFLogxK
U2 - 10.1109/CYBER.2017.8446566
DO - 10.1109/CYBER.2017.8446566
M3 - Conference contribution
AN - SCOPUS:85053845896
SN - 9781538604892
T3 - 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
SP - 1496
EP - 1499
BT - 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th IEEE Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
Y2 - 31 July 2017 through 4 August 2017
ER -