ESD Protection Design with Low-Leakage Consideration for Silicon Chips of IoT Applications

Ming Dou Ker, Chun Yu Lin, Yi Han Wu, Wen Tai Wang

研究成果: 書貢獻/報告類型會議論文篇章

1 引文 斯高帕斯(Scopus)

摘要

On-chip electrostatic discharge (ESD) protection design with low-leakage consideration for the silicon chips of IoT applications is presented. The proposed ESD protection design uses the fast turn-on silicon-controlled rectifier (SCR) device to implement the power-rail ESD clamp circuit. Experimental results verified in TSMC 28nm CMOS process have shown that the proposed design has advantages of low leakage current (2∼3nA), low trigger voltage (∼2V), high ESD robustness (>8kV), and free to latchup issue.

原文英語
主出版物標題2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1496-1499
頁數4
ISBN(列印)9781538604892
DOIs
出版狀態已發佈 - 2018 八月 24
事件7th IEEE Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017 - Honolulu, 美国
持續時間: 2017 七月 312017 八月 4

出版系列

名字2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017

會議

會議7th IEEE Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017
國家/地區美国
城市Honolulu
期間2017/07/312017/08/04

ASJC Scopus subject areas

  • 人工智慧
  • 電腦科學應用
  • 控制和優化

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