ESD protection design for high-speed circuits in nanoscale CMOS process

Chun Yu Lin, Rong Kun Chang

研究成果: 書貢獻/報告類型 › 會議論文篇章

指紋

深入研究「ESD protection design for high-speed circuits in nanoscale CMOS process」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Chemical Compounds