ESD protection design for high-speed circuits in nanoscale CMOS process

Chun Yu Lin, Rong Kun Chang

研究成果: 書貢獻/報告類型會議論文篇章

摘要

To protect the high-speed integrated circuits from electrostatic discharge (ESD) damages, the ESD protection design of inductor-assisted silicon-controlled rectifier (LASCR) is investigated in this work. Compared with the conventional ESD protection design of dual-diode, the LASCR has better high-speed performances and higher ESD robustness. Therefore, the LASCR is very suitable for high-speed applications.

原文英語
主出版物標題2016 International Symposium on Integrated Circuits, ISIC 2016
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781467390194
DOIs
出版狀態已發佈 - 2017 一月 23
事件2016 International Symposium on Integrated Circuits, ISIC 2016 - Singapore, 新加坡
持續時間: 2016 十二月 122016 十二月 14

出版系列

名字2016 International Symposium on Integrated Circuits, ISIC 2016

會議

會議2016 International Symposium on Integrated Circuits, ISIC 2016
國家/地區新加坡
城市Singapore
期間2016/12/122016/12/14

ASJC Scopus subject areas

  • 電氣與電子工程
  • 電子、光磁材料
  • 電腦網路與通信
  • 硬體和架構

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