TY - GEN
T1 - ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR
AU - Ker, Ming Dou
AU - Lin, Chun Yu
AU - Meng, Guo Xuan
PY - 2008
Y1 - 2008
N2 - Waffle-structured SCR (silicon-controlled rectifier) has been studied as an effective on-chip ESD (electrostatic discharge) protection device for CMOS RF (radio-frequency) circuits. In this work, a novel on-chip ESD protection strategy using the waffle-structured SCR is proposed and co-designed with a CMOS UWB (ultra-wideband) PA (power amplifier). Before ESD stress, the RF performances of the ESD-protected PA have been demonstrated to be as well as that of the unprotected PA. After ESD stress, the unprotected PA was seriously degraded, whereas the ESD-protected PA was keeping the performances well.
AB - Waffle-structured SCR (silicon-controlled rectifier) has been studied as an effective on-chip ESD (electrostatic discharge) protection device for CMOS RF (radio-frequency) circuits. In this work, a novel on-chip ESD protection strategy using the waffle-structured SCR is proposed and co-designed with a CMOS UWB (ultra-wideband) PA (power amplifier). Before ESD stress, the RF performances of the ESD-protected PA have been demonstrated to be as well as that of the unprotected PA. After ESD stress, the unprotected PA was seriously degraded, whereas the ESD-protected PA was keeping the performances well.
UR - https://www.scopus.com/pages/publications/51749096660
UR - https://www.scopus.com/pages/publications/51749096660#tab=citedBy
U2 - 10.1109/ISCAS.2008.4541662
DO - 10.1109/ISCAS.2008.4541662
M3 - Conference contribution
AN - SCOPUS:51749096660
SN - 9781424416844
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 1292
EP - 1295
BT - 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
T2 - 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
Y2 - 18 May 2008 through 21 May 2008
ER -