ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR

Ming Dou Ker, Chun-Yu Lin, Guo Xuan Meng

研究成果: 書貢獻/報告類型會議貢獻

3 引文 斯高帕斯(Scopus)

摘要

Waffle-structured SCR (silicon-controlled rectifier) has been studied as an effective on-chip ESD (electrostatic discharge) protection device for CMOS RF (radio-frequency) circuits. In this work, a novel on-chip ESD protection strategy using the waffle-structured SCR is proposed and co-designed with a CMOS UWB (ultra-wideband) PA (power amplifier). Before ESD stress, the RF performances of the ESD-protected PA have been demonstrated to be as well as that of the unprotected PA. After ESD stress, the unprotected PA was seriously degraded, whereas the ESD-protected PA was keeping the performances well.

原文英語
主出版物標題2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
頁面1292-1295
頁數4
DOIs
出版狀態已發佈 - 2008 九月 19
事件2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, 美国
持續時間: 2008 五月 182008 五月 21

出版系列

名字Proceedings - IEEE International Symposium on Circuits and Systems
ISSN(列印)0271-4310

其他

其他2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
國家美国
城市Seattle, WA
期間08/5/1808/5/21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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