ESD protection design for differential low-noise amplifier with cross-coupled SCR

Chun Yu Lin; Ming Dou Ker; Yuan Wen Hsiao

doi:10.1109/ICICDT.2010.5510294

ESD protection design for differential low-noise amplifier with cross-coupled SCR

Chun Yu Lin^*, Ming Dou Ker, Yuan Wen Hsiao

^*此作品的通信作者

研究成果: 書貢獻/報告類型 › 會議論文篇章

1 引文斯高帕斯（Scopus）

摘要

A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

原文	英語
主出版物標題	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
頁面	39-42
頁數	4
DOIs	https://doi.org/10.1109/ICICDT.2010.5510294
出版狀態	已發佈 - 2010
對外發佈	是
事件	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, 法国持續時間: 2010 6月 2 → 2010 6月 4

出版系列

名字	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

其他

其他	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
國家/地區	法国
城市	Grenoble
期間	2010/06/02 → 2010/06/04

ASJC Scopus subject areas

硬體和架構
電氣與電子工程

存取文件

10.1109/ICICDT.2010.5510294

其它文件與鏈接

引用此

Lin, C. Y., Ker, M. D., & Hsiao, Y. W. (2010). ESD protection design for differential low-noise amplifier with cross-coupled SCR. 於 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 (頁 39-42). [5510294] (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). https://doi.org/10.1109/ICICDT.2010.5510294

ESD protection design for differential low-noise amplifier with cross-coupled SCR. / Lin, Chun Yu; Ker, Ming Dou; Hsiao, Yuan Wen.

2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. 2010. p. 39-42 5510294 (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010).

研究成果: 書貢獻/報告類型 › 會議論文篇章

Lin, CY, Ker, MD & Hsiao, YW 2010, ESD protection design for differential low-noise amplifier with cross-coupled SCR. 於 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010., 5510294, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, 頁 39-42, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, Grenoble, 法国, 2010/06/02. https://doi.org/10.1109/ICICDT.2010.5510294

@inproceedings{3800be2eaff64674939a73f1204997a3,

title = "ESD protection design for differential low-noise amplifier with cross-coupled SCR",

abstract = "A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.",

author = "Lin, {Chun Yu} and Ker, {Ming Dou} and Hsiao, {Yuan Wen}",

year = "2010",

doi = "10.1109/ICICDT.2010.5510294",

language = "English",

isbn = "9781424457748",

series = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010",

pages = "39--42",

booktitle = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010",

note = "2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 ; Conference date: 02-06-2010 Through 04-06-2010",

}

TY - GEN

T1 - ESD protection design for differential low-noise amplifier with cross-coupled SCR

AU - Lin, Chun Yu

AU - Ker, Ming Dou

AU - Hsiao, Yuan Wen

PY - 2010

Y1 - 2010

N2 - A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

AB - A new electrostatic discharge (ESD) protection scheme for differential low-noise amplifier (LNA) was proposed in this paper. The new ESD protection scheme, which evolved from the conventional double-diode ESD protection scheme without adding any extra device, was realized with cross-coupled silicon-controlled rectifier (SCR). With the new ESD protection scheme, the pin-to-pin ESD robustness can be improved, which was the most critical ESD-test pin combination for differential input pads. Experimental results had shown that differential LNA with cross-coupled-SCR ESD protection scheme can achieve excellent ESD robustness and good RF performances.

UR - http://www.scopus.com/inward/record.url?scp=77955607970&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77955607970&partnerID=8YFLogxK

U2 - 10.1109/ICICDT.2010.5510294

DO - 10.1109/ICICDT.2010.5510294

M3 - Conference contribution

AN - SCOPUS:77955607970

SN - 9781424457748

T3 - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

SP - 39

EP - 42

BT - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

T2 - 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Y2 - 2 June 2010 through 4 June 2010

ER -

ESD protection design for differential low-noise amplifier with cross-coupled SCR

摘要

出版系列

其他

ASJC Scopus subject areas

存取文件

其它文件與鏈接

指紋

引用此