Enhancing personalized feedback system by visual biometric data analysis

Jingyun Wang, Hong Fa Ho, Yuichi Ono

研究成果: 書貢獻/報告類型會議貢獻

摘要

This paper propose to develop and evaluate a learning support system which can provide personalized feedbacks for helping learners to improve their learning ability. To support the analysis of learners' cognitive processes during learning activities, this system will collect not only their learning logs and questionnaires' responses, but also their visual biometric data (eye-movement data). Eye-tracking systems with not only eye safety advance but also precision advance will be used in this research. By analyzing all the collected data, the system will identify learners' characteristics and provide real-time feedbacks in response to their characteristics.

原文英語
主出版物標題Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
編輯Ayako Hiramatsu, Tokuro Matsuo, Akimitsu Kanzaki, Norihisa Komoda
發行者Institute of Electrical and Electronics Engineers Inc.
頁面410-413
頁數4
ISBN(電子)9781467389853
DOIs
出版狀態已發佈 - 2016 八月 31
事件5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 - Kumamoto, 日本
持續時間: 2016 七月 102016 七月 14

出版系列

名字Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016

其他

其他5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
國家日本
城市Kumamoto
期間16/7/1016/7/14

ASJC Scopus subject areas

  • Information Systems
  • Computer Networks and Communications
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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  • 引用此

    Wang, J., Ho, H. F., & Ono, Y. (2016). Enhancing personalized feedback system by visual biometric data analysis. 於 A. Hiramatsu, T. Matsuo, A. Kanzaki, & N. Komoda (編輯), Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 (頁 410-413). [7557644] (Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IIAI-AAI.2016.231