The current-voltage (I-V) characteristics of the InGaN nanorod light-emitting diode (LED) are evaluated using nanoprobes installed on a field-emission scanning electron microscope. The saturated current of the InGaN nanorod LED (IO = 2×10-9A is found to be orders of magnitude higher than those obtained by downscaling a conventional InGaN LED to a chip size of 300 ×300μm2 (IO1=1×10 -25AIO2=1×10-14A). This observation is explained by the fact that the nanorod LED is associated with enhanced tunneling of injected carriers and, therefore, reduction of the defect-assisted leakage current and the diffusion-recombination process that normally occurs in InGaN LEDs.
|頁（從 - 到）||985-989|
|期刊||IEEE Journal on Selected Topics in Quantum Electronics|
|出版狀態||已發佈 - 2011 7月|
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