摘要
The method of electron paramagnetic resonance (EPR) has been used to study the n-type semiconducting Ru(S1-xSex)2 single crystals grown by the method of chemical vapor transport. A chalcogen point defect model is established to account for the S=1/2 paramagnetic species detected by EPR. This model assumes that an X2-(X=S or Se)-X vacancy pair behaves like an electron donor. The g-factor anisotropy is dependent upon the degree of chalcogen deficiency which is interpreted as due to the formation of a narrow band by the magnetic electrons of the chalcogen defect below the bottom of the conduction band.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 1796-1799 |
| 頁數 | 4 |
| 期刊 | Journal of Applied Physics |
| 卷 | 68 |
| 發行號 | 4 |
| DOIs | |
| 出版狀態 | 已發佈 - 1990 |
ASJC Scopus subject areas
- 一般物理與天文學
指紋
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