TY - GEN
T1 - Effective subpixel edge detection for LED probes
AU - Su, Chung Yen
AU - Yu, Li An
AU - Chen, Nai Kuei
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/2/6
Y1 - 2017/2/6
N2 - The market of light-emitting devices (LED) is growing dramatically over these years. To test the quality of LEDs, lots of LED probes are required. Therefore, it is important to develop an effective method to measure the angle (around 10 degrees) and the radius (15 μm ∼ 30 μm) of a produced LED probe. In this study, we propose a new subpixel edge detection for LED probes. The proposed method mainly consists of a coarse edge detection by Canny operators and a fine edge detection by a reconstructive method. In addition, an Otsu thresholding and a reflecting-point removal are included to reduce noise and increase accuracy. Compared to the previous methods, the proposed method can further reduce angle error up to 19.5% and the radius error up to 24.8%, respectively.
AB - The market of light-emitting devices (LED) is growing dramatically over these years. To test the quality of LEDs, lots of LED probes are required. Therefore, it is important to develop an effective method to measure the angle (around 10 degrees) and the radius (15 μm ∼ 30 μm) of a produced LED probe. In this study, we propose a new subpixel edge detection for LED probes. The proposed method mainly consists of a coarse edge detection by Canny operators and a fine edge detection by a reconstructive method. In addition, an Otsu thresholding and a reflecting-point removal are included to reduce noise and increase accuracy. Compared to the previous methods, the proposed method can further reduce angle error up to 19.5% and the radius error up to 24.8%, respectively.
KW - Computer vision system
KW - Image processing
KW - LED probe
KW - Subpixel edge detection
UR - http://www.scopus.com/inward/record.url?scp=85015800389&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85015800389&partnerID=8YFLogxK
U2 - 10.1109/SMC.2016.7844270
DO - 10.1109/SMC.2016.7844270
M3 - Conference contribution
AN - SCOPUS:85015800389
T3 - 2016 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2016 - Conference Proceedings
SP - 379
EP - 382
BT - 2016 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2016 - Conference Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2016
Y2 - 9 October 2016 through 12 October 2016
ER -