摘要
The effect of Ta2O5 doping on electrical characteristics of SrTiO3 (STO) metal-insulator-metal (MIM) capacitors was studied for the first time. Using Ta2O5-doped STO dielectrics, an absolute quadratic voltage coefficient of capacitance (VCC-α) of 510ppm/V2 and a high capacitance density of ̃20fF/μm 2 are achieved. These are approximately one order of magnitude lower than those of the MIM capacitor fabricated using a pure STO. In addition, the degradation of electrical properties (capacitance variation versus voltage, VCC-α, and longterm reliability) after electrical stressing is reduced, compared with that of an MIM capacitor fabricated using a pure STO.
原文 | 英語 |
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頁(從 - 到) | 814011-814016 |
頁數 | 6 |
期刊 | Japanese Journal of Applied Physics |
卷 | 48 |
發行號 | 8 Part 1 |
DOIs | |
出版狀態 | 已發佈 - 2009 |
對外發佈 | 是 |
ASJC Scopus subject areas
- 一般工程
- 一般物理與天文學