Effect of focused ion beam deposition induced contamination on the transport properties of nano devices

Yann Wen Lan, Wen Hao Chang, Yuan Chih Chang, Chia Seng Chang, Chii Dong Chen

研究成果: 雜誌貢獻期刊論文同行評審

16 引文 斯高帕斯(Scopus)

指紋

深入研究「Effect of focused ion beam deposition induced contamination on the transport properties of nano devices」主題。共同形成了獨特的指紋。

Engineering

Material Science

Chemistry

INIS

Pharmacology, Toxicology and Pharmaceutical Science

Physics