Effect of focused ion beam deposition induced contamination on the transport properties of nano devices
Yann Wen Lan, Wen Hao Chang, Yuan Chih Chang, Chia Seng Chang, Chii Dong Chen
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
16
引文
斯高帕斯(Scopus)