Edge reconstruction of LED probes using various segmentation and the averaging of sub-pixels

Ying Hao Liu, Chung Yen Su, Li An Yu, Nai Kuei Chen

研究成果: 書貢獻/報告類型會議貢獻

摘要

LED probes are essential for testing the quality of LEDs, gaining its attention among industrial applications. Disturbance factors such as dust or noise affections may occur during the manufacturing process of the LED probes, which leads angle error to increase. With the increasing demand for LED probes, higher precision and efficiency are expected by users. Efficient method for edge detection and the preciseness of angle is crucial in our study. The previous study presents a method using Scharr Edge Detection and Adaptive Reconstruction. In this paper, we add a new method based on various segmentation and the averaging of sub-pixels(VSAS). Experimental result indicates that this method provides higher precision, with and an average error less than 1 % compared to the other previous methods.

原文英語
主出版物標題ICIIBMS 2015 - International Conference on Intelligent Informatics and Biomedical Sciences
發行者Institute of Electrical and Electronics Engineers Inc.
頁面5-8
頁數4
ISBN(電子)9781479985623
DOIs
出版狀態已發佈 - 2016 三月 22
事件International Conference on Intelligent Informatics and Biomedical Sciences, ICIIBMS 2015 - Okinawa, 日本
持續時間: 2015 十一月 282015 十一月 30

出版系列

名字ICIIBMS 2015 - International Conference on Intelligent Informatics and Biomedical Sciences

其他

其他International Conference on Intelligent Informatics and Biomedical Sciences, ICIIBMS 2015
國家日本
城市Okinawa
期間15/11/2815/11/30

ASJC Scopus subject areas

  • Signal Processing
  • Health Informatics
  • Biotechnology
  • Artificial Intelligence

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  • 引用此

    Liu, Y. H., Su, C. Y., Yu, L. A., & Chen, N. K. (2016). Edge reconstruction of LED probes using various segmentation and the averaging of sub-pixels. 於 ICIIBMS 2015 - International Conference on Intelligent Informatics and Biomedical Sciences (頁 5-8). [7439459] (ICIIBMS 2015 - International Conference on Intelligent Informatics and Biomedical Sciences). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICIIBMS.2015.7439459