Dual-Mode GaN MOS-HEMT of Cascode Configuration with Si Ferroelectric Hf1-xZrxO2FET

C. Y. Liao, K. Y. Hsiang, Z. F. Lou, C. Y. Lin, W. C. Ray, F. S. Chang, C. C. Wang, Z. X. Li, H. C. Tseng, J. Y. Lee, P. H. Chen, J. H. Tsai, P. G. Chen*, M. H. Lee

*此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

摘要

The dual-mode (D-mode & E-mode) GaN MOS-HEMT is achieved simultaneously by a Cascode configuration with Si ferroelectric (FE) FET. Due to hole absence in 2DEG of GaN HEMT, the conventional FE-gate stack on GaN is difficult to obtain FE-hysteresis with dipole switching in FE-layer. The proposed method is a solution to accomplish ferroelectric hysteresis for modulated modes of GaN-FET.

原文英語
主出版物標題2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781665459792
DOIs
出版狀態已發佈 - 2022
事件2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022 - Honolulu, 美国
持續時間: 2022 6月 112022 6月 12

出版系列

名字2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022

會議

會議2022 IEEE Silicon Nanoelectronics Workshop, SNW 2022
國家/地區美国
城市Honolulu
期間2022/06/112022/06/12

ASJC Scopus subject areas

  • 硬體和架構
  • 電氣與電子工程
  • 安全、風險、可靠性和品質
  • 電子、光磁材料

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