Double-tip scanning tunneling microscope for surface analysis

Q. Niu, M. C. Chang, C. K. Shih

研究成果: 雜誌貢獻期刊論文同行評審

42 引文 斯高帕斯(Scopus)

摘要

We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.

原文英語
頁(從 - 到)5502-5505
頁數4
期刊Physical Review B
51
發行號8
DOIs
出版狀態已發佈 - 1995

ASJC Scopus subject areas

  • Condensed Matter Physics

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