Dopant mapping of Be δ-doped layers in GaAs tailored by counterdoping using scanning tunneling microscopy

Ph Ebert*, S. Landrock, Y. P. Chiu, U. Breuer, R. E. Dunin-Borkowski

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

7 引文 斯高帕斯(Scopus)

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INIS

Physics

Material Science