Divergent dielectric characteristics in cascaded high-K gate stacks with reverse gradient bandgap structures

Meng Chen Tsai, Po Hsien Cheng, Min-Hung Lee, Hsin Chih Lin, Miin Jang Chen

    研究成果: 雜誌貢獻期刊論文同行評審

    2 引文 斯高帕斯(Scopus)

    指紋 深入研究「Divergent dielectric characteristics in cascaded high-K gate stacks with reverse gradient bandgap structures」主題。共同形成了獨特的指紋。

    Chemical Compounds

    Engineering & Materials Science

    Physics & Astronomy